z-logo
open-access-imgOpen Access
The variation of the enhanced photoluminescence efficiency of Y_2O_3:Eu^3+films with the thickness to the photonic crystal layer
Author(s) -
KiYoung Ko,
Young Kwang Lee,
Hoo Keun Park,
Yoon-Chang Kim,
Young Rag
Publication year - 2008
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.005689
Subject(s) - photoluminescence , materials science , nanorod , optics , photonic crystal , phosphor , diffraction , scattering , excitation , quantum efficiency , optoelectronics , attenuation coefficient , quartz , absorption (acoustics) , crystal (programming language) , nanotechnology , composite material , physics , electrical engineering , engineering , computer science , programming language
This study examined the effects of the thickness of Y(2)O(3):Eu(3+) phosphor films on quartz substrates coated with two-dimensional (2D) SiO(2) square-lattice nanorod photonic crystal layers (PCL) at identical heights on their extraction and absorption efficiency. The photoluminescence (PL) efficiency enhancement ratio decreased exponentially with increasing Y(2)O(3):Eu(3+) film thickness. The 2D PCL-assisted Y(2)O(3):Eu(3+) film with a thickness (t) = 400 nm showed enhancement in the upward and downward PL emission by factors of 6.2 and 8.6, respectively, with respect to those of a conventional flat film. This observation was attributed to diffraction scattering of the excitation and emission light.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here