Open AccessTHz emission Microscopy with sub-wavelength broadband source
Author(s) -
Romain Lecaque,
S. Grésillon,
Claude Boccara
Publication year - 2008
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.004731
Subject(s) - optics , microscope , microscopy , terahertz radiation , near field scanning optical microscope , diffraction , resolution (logic) , wavelength , deconvolution , mie scattering , materials science , optical microscope , ptychography , scattering , light scattering , physics , scanning electron microscope , artificial intelligence , computer science
A versatile THz/IR near field microscope is demonstrated. Collecting the scattered light from a THz in-situ subwavelength source, this microscope provides images with resolution better than lambda/10. The physical origin of the contrast is explained by a Mie scattering diffraction model. Owing to the classical nature of this microscope working in the near field, resolution of THz/IR images is improved using deconvolution process.