THz emission Microscopy with sub-wavelength broadband source | Zendy

Romain Lecaque | Zendy; S. Grésillon | Zendy; Claude Boccara | Zendy

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THz emission Microscopy with sub-wavelength broadband source

Author(s) -

Romain Lecaque,

S. Grésillon,

Claude Boccara

Publication year - 2008

Publication title -

optics express

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.16.004731

Subject(s) - optics , microscope , microscopy , terahertz radiation , near field scanning optical microscope , diffraction , resolution (logic) , wavelength , deconvolution , mie scattering , materials science , optical microscope , ptychography , scattering , light scattering , physics , scanning electron microscope , artificial intelligence , computer science

A versatile THz/IR near field microscope is demonstrated. Collecting the scattered light from a THz in-situ subwavelength source, this microscope provides images with resolution better than lambda/10. The physical origin of the contrast is explained by a Mie scattering diffraction model. Owing to the classical nature of this microscope working in the near field, resolution of THz/IR images is improved using deconvolution process.

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