Open AccessInfluence of surface reflective properties on differential interference contrast microscopy
Author(s) -
Olivier Théodoly,
Sylvain Gabriele,
Marie-Pierre Valignat
Publication year - 2008
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.004547
Subject(s) - differential interference contrast microscopy , optics , contrast (vision) , materials science , interference (communication) , microscopy , interference microscopy , reflection (computer programming) , spatial frequency , refractive index , numerical aperture , aperture (computer memory) , physics , computer science , wavelength , computer network , channel (broadcasting) , acoustics , programming language
We present a model describing the image formation in DIC (Differential Interference Contrast) mode microscopy, by including the actual refractive indexes and reflection coefficients of objects and substrates. We calculate the contrast of flat and level objects of nanometric thickness versus the bias retardation Gamma and the numerical aperture NA. We show that high contrasts, of the edge and of the inner object, can be achieved in DIC mode with special anti-reflective substrates and large NA values. The calculations agree with contrast measurements on nanometric steps of silica and explain also the extreme ability to detect single molecules (stretched DNA molecules).