Open AccessDefocus measurement for random self-affine fractal surfaces
Author(s) -
Jun Wang,
Wei Zhou,
L. E. N. Lim,
Anand Asundi
Publication year - 2008
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.002928
Subject(s) - optics , fractal , cardinal point , fractal dimension , focus (optics) , depth of field , measure (data warehouse) , image plane , plane (geometry) , spatial frequency , physics , mathematics , image (mathematics) , geometry , computer science , computer vision , mathematical analysis , database
We studied correlation between fractal dimensions and image contrast for metallic surfaces. The study has led to an interesting finding that the maximum fractal dimension of the object surface under imaging gives the best focal plane. The significant finding can be made use of to estimate the best focal plane or measure the focus error with high sensitivity of a few microns, which are well within depth of field of the microscopic imaging system.