Open AccessExact determination of the phase in timeresolved X-ray reflectometry
Author(s) -
И. В. Кожевников,
Luca Peverini,
Eric Ziegler
Publication year - 2008
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.000144
Subject(s) - reflectometry , optics , phase retrieval , reflectivity , phase (matter) , amplitude , ptychography , physics , x ray reflectivity , derivative (finance) , materials science , refractive index , phase problem , fourier transform , diffraction , time domain , computer science , quantum mechanics , financial economics , economics , computer vision
An exact solution of the phase retrieval problem is described as applied to in-situ X-ray reflectometry of a growing layered film. The following statement is proved: if the reflectivity R and the derivative dR/dt are known at the time t, then the real and the imaginary parts of the amplitude reflectivity r(t) are found uniquely at this point t.