Open AccessOptical monitoring and real time admittance loci calculation through polarization interferometer
Author(s) -
Cheng Chung Lee,
Kai Wu,
Sheng Hui Chen,
Sheng Ju
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.017536
Subject(s) - optics , interferometry , polarization (electrochemistry) , reflection coefficient , fizeau interferometer , admittance , coherence (philosophical gambling strategy) , reflection (computer programming) , retroreflector , physics , waveplate , materials science , astronomical interferometer , computer science , laser , chemistry , quantum mechanics , programming language , electrical impedance
A simple, low coherence, vibration insensitive, polarization Fizeau interferometer is employed in this novel optical monitoring system proposed to extract the temporal phase change of the reflection coefficient of the growing film stacks. This system can directly detect fluctuating reflection coefficient and obtain the corresponding optical admittance of the growing film in real time.