Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor | Zendy

Zhibo Liu | Zendy; XiaoQing Yan | Zendy; Jianguo Tian | Zendy; Wenyuan Zhou | Zendy; Wei-Ping Zang | Zendy

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Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor

Author(s) -

Zhibo Liu,

XiaoQing Yan,

Jianguo Tian,

Wenyuan Zhou,

Wei-Ping Zang

Publication year - 2007

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.15.013351

Subject(s) - ellipse , nonlinear system , tensor (intrinsic definition) , optics , rotation (mathematics) , measure (data warehouse) , z scan technique , physics , third order , nonlinear optics , mathematical analysis , geometry , mathematics , quantum mechanics , computer science , database , philosophy , theology , astronomy

We present a method that combines the Z-scan technique with nonlinear ellipse rotation (NER) to measure third-order nonlinear susceptibility components. The experimental details are demonstrated, and a comprehensive theoretical analysis is given. The validity of this method is verified by the measurements of the nonlinear susceptibility tensor of a well-characterized liquid, CS2.

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