Open AccessNonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor
Author(s) -
Zhibo Liu,
XiaoQing Yan,
Wenyuan Zhou,
Wei-Ping Zang
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.013351
Subject(s) - ellipse , nonlinear system , tensor (intrinsic definition) , optics , rotation (mathematics) , measure (data warehouse) , z scan technique , physics , third order , nonlinear optics , mathematical analysis , geometry , mathematics , quantum mechanics , computer science , database , philosophy , theology , astronomy
We present a method that combines the Z-scan technique with nonlinear ellipse rotation (NER) to measure third-order nonlinear susceptibility components. The experimental details are demonstrated, and a comprehensive theoretical analysis is given. The validity of this method is verified by the measurements of the nonlinear susceptibility tensor of a well-characterized liquid, CS2.