Open AccessEvidence for inhibited diffraction of light propagating through nanolaminate metallodielectric material
Author(s) -
M. Joseph Roberts,
Andrew J. Guenthner,
Simin Feng
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.011999
Subject(s) - materials science , diffraction , optics , dielectric , amorphous solid , near field scanning optical microscope , refractive index , wavelength , polycarbonate , optical microscope , optoelectronics , scanning electron microscope , composite material , crystallography , chemistry , physics
We report the fabrication and characterization of laterally continuous silver layers alternated with glassy amorphous polycarbonate films with the thickness of each layer much less than the wavelength. Such films exhibit physical phenomena associated with the coupled plasmon resonances. We have characterized light propagation through the resulting metal-dielectric (MD) periodic structures using collection mode Near Field Scanning Optical Microscopy (NSOM). In agreement with published theoretical models, our experiments provide evidence that diffraction can be inhibited for light propagating through metallodielectric nanolaminate.