
Effect of the incident angle on the electric near field of a conical probe for plane wave and Gaussian beam illumination
Author(s) -
Anatoliy V. Goncharenko,
YiaChung Chang
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.011517
Subject(s) - optics , conical surface , electric field , gaussian beam , plane wave , physics , beam (structure) , ray , plane (geometry) , light beam , gaussian , materials science , geometry , mathematics , quantum mechanics , composite material
We consider a simple analytical model for the electric near field of a semi-infinite conical probe and apply it to study the incident angle dependence of the field for the case of side illumination by both the plane wave and the Gaussian beam. The electric near field is shown to peak when approaching the grazing incidence. In some cases, a peak can also occur at an incident angle somewhat below 90 degrees . The results obtained are in qualitative agreement with those for a thin semi-infinite wire and previously published results for the finite-size conical probes.