Open AccessUltrashort pulse characterization by ultra-thin ZnO, GaN, and AlN crystals
Author(s) -
Yohei Kobayashi,
Dai Yoshitomi,
K. Iwata,
Hideyuki Takada,
Kenji Torizuka
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.009748
Subject(s) - materials science , optics , ultrashort pulse , thin film , characterization (materials science) , optoelectronics , semiconductor , micrometer , pulse (music) , nonlinear optics , second harmonic generation , laser , nanotechnology , physics , detector
Ultra-thin semiconductor crystals were investigated as nonlinear materials for second-harmonic generation. Nonlinear susceptibilities of sub-micrometer- thick ZnO, GaN, and AlN crystals were measured, and these crystals were used for sub-10-fs pulse measurement by a fringe-resolved autocorrelation method. We found that a one-cycle pulse could be characterized by using these ultra-thin-film crystals.