Open AccessSurface enhanced ellipsometric contrast (SEEC) basic theory and λ/4 multilayered solutions
Author(s) -
Dominique Ausserré,
Marie-Pierre Valignat
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.008329
Subject(s) - optics , polarizer , fresnel equations , refractive index , materials science , contrast (vision) , fresnel diffraction , dielectric , surface (topology) , ellipsometry , refractive index contrast , microscopy , lambda , high contrast , microscope , diffraction , physics , birefringence , optoelectronics , thin film , nanotechnology , geometry , mathematics , pathology , fabrication , medicine , alternative medicine
The fundamentals of a new high contrast technique for optical microscopy, named "Surface Enhanced Ellipsometric Contrast" (SEEC), are presented. The technique is based on the association of enhancing contrast surfaces as sample stages and microscope observation between cross polarizers. The surfaces are designed to become anti-reflecting when used in these conditions. They are defined by the simple equation r(p) + r(s) = 0 between their two Fresnel coefficients. Most often, this equation can be met by covering a solid surface with a single lambda/4 layer with a well defined refractive index. A higher flexibility is obtained with multilayer stacks. Solutions with an arbitrary number of all-dielectric lambda/4 layers are derived.