Open AccessElectro-optic phase modulation in ridge waveguides of epitaxial K_0.95Na_0.05Ta_0.71Nb_0.29O_3 thin films
Author(s) -
Christian Herzog,
Steffen Reidt,
G. Poberaj,
Peter Günter
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.007642
Subject(s) - tantalate , optics , materials science , refractive index , thin film , figure of merit , phase modulation , lithium tantalate , epitaxy , modulation (music) , phase (matter) , crystal (programming language) , optoelectronics , dielectric , ferroelectricity , lithium niobate , physics , layer (electronics) , phase noise , acoustics , computer science , composite material , programming language , nanotechnology , quantum mechanics
Electro-optic modulation at lambda=1.5 mum has been demonstrated for the first time to the best of our knowledge in a ridge waveguide phase modulator produced in cubic potassium sodium tantalate niobate thin films epitaxially grown on potassium tantalate substrates exploiting the large quadratic electro-optic Kerr coefficient of R11 = 8.2x10(-17) m(2)/V(2). The relative permittivity, Kerr coefficient, and refractive index have been evaluated for the thin film crystal and are compared to the values measured in bulk crystals. The half-wave voltage times length figure of merit of the modulator has been measured to be Vpil=38 Vcm at room temperature.