Open AccessGeneralized formulation for performance degradations due to bending and edge scattering loss in microdisk resonators
Author(s) -
John E. Heebner,
Tiziana C. Bond,
J S Kallman
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.004452
Subject(s) - optics , resonator , finesse , refractive index , scattering , materials science , cladding (metalworking) , bend radius , surface roughness , radius , whispering gallery wave , surface finish , enhanced data rates for gsm evolution , rayleigh scattering , bending , physics , laser , composite material , fabry–pérot interferometer , telecommunications , computer security , computer science
We present a generalized formulation for the treatment of both bending (whispering gallery) loss and scattering loss due to edge roughness in microdisk resonators. The results are applicable to microrings and related geometries. For thin disks with radii greater than the bend-loss limit, we find that the finesse limited by the scattering losses induced by edge roughness is independent of radii. While a strong lateral refractive index contrast is necessary to prevent bending losses, unless the radii are of the order of a few microns, lateral air-cladding is detrimental and only enhances scattering losses. The generalized formulation provides a framework for selecting the refractive index contrast that optimizes the finesse at a given radius.