Open AccessOptical constant determination of an anisotropic thin film via polarization conversion
Author(s) -
YiJun Jen,
Cheng-Yu Peng,
Heng-Hao Chang
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.004445
Subject(s) - optics , materials science , polarization (electrochemistry) , anisotropy , refractive index , thin film , circular polarization , physics , chemistry , nanotechnology , microstrip
This study presents a simple method for determining the optical constants of an anisotropic thin film. The sensitivity of enhanced polarization conversion reflectance to optical constants is also calculated and analyzed. Based on the sensitivity calculation, the principal indices and columnar tilt angle can be derived from the polarization conversion reflectance angular spectrum.