
Negative refraction imaging in a hybrid photonic crystal device at near-infrared frequencies
Author(s) -
Zhigang Lu,
Binglin Miao,
Timothy Hodson,
Lin Chang-hu,
Janusz Murakowski,
Dennis W. Prather
Publication year - 2007
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.15.001286
Subject(s) - photonic crystal , negative refraction , yablonovite , optics , photonic integrated circuit , materials science , optoelectronics , photonics , photonic metamaterial , hexagonal lattice , refractive index , physics , antiferromagnetism , condensed matter physics
We present the experimental demonstration of imaging of a point source by negative refraction at near-infrared frequencies using a hybrid photonic crystal device. The photonic crystal device, fabricated by patterning holes in 260nm silicon-on-insulator, integrates a triangular-lattice photonic crystal with a large photonic bandgap and square-lattice photonic crystal with negative refraction. Experimental results show that the output of a line-defect photonic bandgap waveguide provides a nearly ideal point source and then is imaged through the photonic crystal by negative refraction.