Negative refraction imaging in a hybrid photonic crystal device at near-infrared frequencies

We present the experimental demonstration of imaging of a point source by negative refraction at near-infrared frequencies using a hybrid photonic crystal device. The photonic crystal device, fabricated by patterning holes in 260nm silicon-on-insulator, integrates a triangular-lattice photonic crystal with a large photonic bandgap and square-lattice photonic crystal with negative refraction. Experimental results show that the output of a line-defect photonic bandgap waveguide provides a nearly ideal point source and then is imaged through the photonic crystal by negative refraction.