Open AccessSimulations of atomic resolution tip-enhanced optical microscopy
Author(s) -
Andrew Downes,
Donald Salter,
Alistair Elfick
Publication year - 2006
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.14.011324
Subject(s) - optics , nanometrology , near field scanning optical microscope , near field optics , materials science , microscopy , image resolution , diffraction , resolution (logic) , electric field , optical microscope , nanoscopic scale , nanophotonics , near and far field , superlens , nanotechnology , physics , refractive index , scanning electron microscope , metrology , quantum mechanics , artificial intelligence , computer science
Optical techniques can access a wealth of information but traditionally their resolution has been restricted by the diffraction limit. Near-field techniques, which used nanoscale apertures or nanotip electric field enhancement, have succeeded in circumventing Abbe's law. We show that atomic resolution is theoretically achievable for tip enhanced optical microscopy. Using finite element analysis of the electromagnetic field around a small radius metallic scanning probe microscopy tip, we modeled various tip radii and materials, and an aqueous environment as well as ambient air. For a 1 nm gold tip we predict a strong red shift, and surprisingly high values for the enhancement of the intensity of scattered light - over 10(7). For this tip, we predict that 0.2 nm lateral resolution in optical imaging is achievable - good enough to resolve individual atomic bonds. The promise of optical data at these spatial scales offers great potential for nanometrology and nanotechnology applications.