Open AccessHighly sensitive spectral interferometric four-wave mixing microscopy near the shot noise limit and its combination with two-photon excited fluorescence microscopy
Author(s) -
Keisuke Isobe,
Yasuyuki Ozeki,
Takehito Kawasumi,
Shogo Kataoka,
Shin’ichiro Kajiyama,
Kiichi Fukui,
Kazuyoshi Itoh
Publication year - 2006
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.14.011204
Subject(s) - optics , four wave mixing , microscopy , materials science , interferometry , fluorescence , noise (video) , fluorescence microscope , shot noise , physics , laser , nonlinear optics , detector , artificial intelligence , computer science , image (mathematics)
We present spectral interferometric four-wave mixing (FWM) microscopy with a nearly shot-noise limited sensitivity and with the capability of separating FWM signals from fluorescence signals. We analyze the requirements for obtaining the shot-noise limited sensitivity and experimentally achieve the sensitivity that is only 4-dB lower than the shot-noise limit. Moreover, we show that only FWM signals can be extracted through the Fourier filtering even when the FWM spectrum is overlapped and overwhelmed by the fluorescence spectrum. We demonstrate simultaneous acquisition of FWM and two-photon excited fluorescence images of fluorescent monodispersed polystyrene microspheres.