Open AccessCalibration-based two-frequency projected fringe profilometry: a robust, accurate, and single-shot measurement for objects with large depth discontinuities
Author(s) -
WeiHung Su,
Hongyu Liu
Publication year - 2006
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.14.009178
Subject(s) - profilometer , classification of discontinuities , calibration , optics , structured light 3d scanner , computer science , phase (matter) , single shot , spatial frequency , phase retrieval , physics , mathematics , scanner , mathematical analysis , quantum mechanics , fourier transform , surface roughness
An improved method is proposed to perform calibration-based fringe projected profilometry using a two-frequency fringe pattern for the 3D shape measurements of objects with large discontinuous height steps. A fabrication scheme for the two-frequency pattern is described as well. The proposed method offers following major advantages: (1) only one phase measurement needed for operation, (2) easiness for calibration, (3) robust performance, especially for automatic phase unwrapping, and (4) more flexible data acquisition for complex objects. This makes it possible for a single-shot measurement of dynamic objects with discontinuities. Both theoretical descriptions and experimental demonstrations are provided.