Open AccessImpact of structural deformations on polarization conversion in high index contrast waveguides
Author(s) -
Kuniaki Kakihara,
Naoya Kono,
Kunimasa Saitoh,
Takeshi Fujisawa,
Masanori Koshiba
Publication year - 2006
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.14.007046
Subject(s) - optics , polarization (electrochemistry) , refractive index , materials science , beam propagation method , high contrast , finite element method , refractive index contrast , physics , fabrication , chemistry , thermodynamics , medicine , alternative medicine , pathology
The objective of this paper is the detailed study of polarization conversion in deformed high index contrast (HIC) waveguides. The type of deformation considered here is the slanted sidewalls of buried channel waveguides. Polarization conversion of HIC waveguides are investigated for possible core refractive indices ranging from 2 (SiN(x)) to 3.5 (Si), by using numerical schemes based on the finite-element and beam propagation methods. The numerical results show that polarization conversion can be greatly magnified in HIC channel waveguides. For example, in Si-wire waveguides, complete polarization conversions can occur within just tens of micrometers.