Open AccessDependence of mode characteristics on the central defect in elliptical hole photonic crystal fibers
Author(s) -
Zhi Wang,
Guobin Ren,
Shuqin Lou,
Shuisheng Jian
Publication year - 2003
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.11.001966
Subject(s) - optics , photonic crystal , total internal reflection , birefringence , materials science , supercell , photonic crystal fiber , reflection (computer programming) , yablonovite , optical fiber , physics , photonic integrated circuit , thunderstorm , meteorology , computer science , programming language
Some mode characteristics are obtained by the full vector supercell overlap method that has been developed to model triangular lattice elliptical hole photonic crystal fibers regardless of whether the light is guided by total internal reflection or a photonic bandgap mechanism. When the central defect hole is large enough, the modes are disordered. Birefringence (Deltan) dependence on the central defect is discussed in detail by numerical analysis.