Open AccessDirect observation of second-harmonic generation from crystalline particles in Ge-doped SiO2 glass films
Author(s) -
Takeshi Fujiwara,
Takashi Sawada,
Yasuhiko Benino,
Takayuki Komatsu,
Masakuni Takahashi,
Toshinobu Yoko,
Junji Nishii
Publication year - 2003
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.11.001598
Subject(s) - materials science , second harmonic generation , optics , diffraction , doping , laser , ultraviolet , germanium , phase (matter) , wavelength , chemical vapor deposition , thin film , refractive index , optoelectronics , silicon , nanotechnology , chemistry , physics , organic chemistry
The authors report what is, to our best knowledge, the first observation of second-harmonic generation (SHG) directly from the crystalline particles in Ge-doped SiO2 (Ge:SiO2) glass films. Ge:SiO2 glass films with approximately 5 microm thickness were fabricated by chemical vapor-phase deposition. X-ray diffraction (XRD) peaks at around 2theta=22 degrees in thermally crystallized Ge:SiO2 films were observed, and obtained XRD patterns are exactly the same as those in ultraviolet-laser-poled Ge:SiO2 glasses. Using SHG microscopic technique with a Nd:YAG laser, it has been successfully found that SH emitting with 532 nm wavelength is observed directly from the crystalline particles induced in the crystallized films.