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Retrieval of the complex-valued refractive index of germanium near the M4,5 absorption edge
Author(s) -
Christopher J. Kaplan,
Peter M. Kraus,
Eric M. Gullikson,
Lauren Borja,
Scott K. Cushing,
Michael Zürch,
Hung-Tzu Chang,
Daniel M. Neumark,
Stephen R. Leone
Publication year - 2019
Publication title -
journal of the optical society of america. b, optical physics/journal of the optical society of america. b, online
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.741
H-Index - 144
eISSN - 1520-8540
pISSN - 0740-3224
DOI - 10.1364/josab.36.001716
Subject(s) - refractive index , germanium , optics , refraction , synchrotron radiation , extreme ultraviolet , materials science , total internal reflection , total external reflection , angle of incidence (optics) , absorption (acoustics) , reflection (computer programming) , x ray optics , physics , optoelectronics , x ray , laser , silicon , computer science , programming language

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