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Retrieval of the complex-valued refractive index of germanium near the M4,5 absorption edge
Author(s) -
Christopher J. Kaplan,
Peter M. Kraus,
Eric M. Gullikson,
Lauren Borja,
Scott K. Cushing,
Michael Zürch,
Hung-Tzu Chang,
Daniel M. Neumark,
Stephen R. Leone
Publication year - 2019
Publication title -
journal of the optical society of america b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.741
H-Index - 144
eISSN - 1520-8540
pISSN - 0740-3224
DOI - 10.1364/josab.36.001716
Subject(s) - refractive index , germanium , refraction , optics , synchrotron radiation , extreme ultraviolet , total internal reflection , materials science , absorption (acoustics) , total external reflection , angle of incidence (optics) , reflection (computer programming) , physics , optoelectronics , laser , silicon , computer science , programming language

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