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Modified wavelength scanning interferometry for simultaneous tomography and topography of the cornea with Fourier domain optical coherence tomography
Author(s) -
Susobhan Das,
Chih-Hao Liu,
Manmohan Singh,
Michael D. Twa,
Kirill V. Larin
Publication year - 2018
Publication title -
biomedical optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.362
H-Index - 86
ISSN - 2156-7085
DOI - 10.1364/boe.9.004443
Subject(s) - optical coherence tomography , optics , materials science , interferometry , tomography , surface roughness , white light interferometry , cornea , micrometer , optical tomography , physics , composite material
Visual acuity is dependent on corneal shape and size. A minor variation in surface geometry can cause a deformation of corneal geometry, which affects its optical performance. In this work we demonstrate an algorithm for the simultaneous measurement of corneal tomography and topography with a traditional point-scanning Fourier domain optical coherence tomography (FD-OCT) system. A modified wavelength scanning interferometry (mWSI) algorithm enabled topographical evaluation of the surface with nanometer-scale resolution, which is superior to the micrometer-scale resolution of traditional OCT structural imaging. We validated the technique with an optically flat mirror, standard roughness gauges, and atomic force microscopy (AFM). The mirror results show nanometer-scale sensitivity (~3.5 nm), and the mWSI measurements were in good agreement (error ~5%) with the specifications of the roughness comparator and AFM, demonstrating the accuracy of the technique. Following validation, the measurements were made on pig corneas in situ at various artificially controlled intraocular pressures (IOP) and before and after cross-linking (CXL). The results show that the mean surface roughness increased by ~65% after removal of the epithelium in preparation for CXL but did not change as a function of IOP. The demonstrated method could be used for simultaneous measurement of tissue tomography with micrometer-precision and topography with nanometer-precision.

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