Implementation of spatial overlap modulation nonlinear optical microscopy using an electro-optic deflector | Zendy

Keisuke Isobe | Zendy; Hiroyuki Kawano | Zendy; Akiko Kumagai | Zendy; Atsushi Miyawaki | Zendy; Katsumi Midorikawa | Zendy

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Implementation of spatial overlap modulation nonlinear optical microscopy using an electro-optic deflector

Author(s) -

Keisuke Isobe,

Hiroyuki Kawano,

Akiko Kumagai,

Atsushi Miyawaki,

Katsumi Midorikawa

Publication year - 2013

Publication title -

biomedical optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.362

H-Index - 86

ISSN - 2156-7085

DOI - 10.1364/boe.4.001937

Subject(s) - optics , demodulation , modulation (music) , spatial frequency , microscopy , image resolution , materials science , optical transfer function , focus (optics) , frequency modulation , imaging phantom , physics , computer science , telecommunications , radio frequency , acoustics , channel (broadcasting)

A spatial overlap modulation (SPOM) technique is a nonlinear optical microscopy technique which enhances the three-dimensional spatial resolution and rejects the out-of-focus background limiting the imaging depth inside a highly scattering sample. Here, we report on the implementation of SPOM in which beam pointing modulation is achieved by an electro-optic deflector. The modulation and demodulation frequencies are enhanced to 200 kHz and 400 kHz, respectively, resulting in a 200-fold enhancement compared with the previously reported system. The resolution enhancement and suppression of the out-of-focus background are demonstrated by sum-frequency-generation imaging of pounded granulated sugar and deep imaging of fluorescent beads in a tissue-like phantom, respectively.

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