Open AccessImplementation of spatial overlap modulation nonlinear optical microscopy using an electro-optic deflector
Author(s) -
Keisuke Isobe,
Hiroyuki Kawano,
Akiko Kumagai,
Atsushi Miyawaki,
Katsumi Midorikawa
Publication year - 2013
Publication title -
biomedical optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.362
H-Index - 86
ISSN - 2156-7085
DOI - 10.1364/boe.4.001937
Subject(s) - optics , demodulation , modulation (music) , spatial frequency , microscopy , image resolution , materials science , optical transfer function , focus (optics) , frequency modulation , imaging phantom , physics , computer science , telecommunications , radio frequency , acoustics , channel (broadcasting)
A spatial overlap modulation (SPOM) technique is a nonlinear optical microscopy technique which enhances the three-dimensional spatial resolution and rejects the out-of-focus background limiting the imaging depth inside a highly scattering sample. Here, we report on the implementation of SPOM in which beam pointing modulation is achieved by an electro-optic deflector. The modulation and demodulation frequencies are enhanced to 200 kHz and 400 kHz, respectively, resulting in a 200-fold enhancement compared with the previously reported system. The resolution enhancement and suppression of the out-of-focus background are demonstrated by sum-frequency-generation imaging of pounded granulated sugar and deep imaging of fluorescent beads in a tissue-like phantom, respectively.