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Tip-enhanced Raman Spectroscopy for Nanoscale Characterization
Author(s) -
Bin Ren
Publication year - 2017
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.1364/asa.2017.asu1a.3
Subject(s) - raman spectroscopy , characterization (materials science) , nanoscopic scale , nanometre , materials science , image resolution , bimetallic strip , resolution (logic) , nanotechnology , spectroscopy , analytical chemistry (journal) , optics , chemistry , computer science , physics , metal , chromatography , quantum mechanics , artificial intelligence , metallurgy , composite material

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