Open AccessMeasuring photoelastic coefficients with Schaefer–Bergmann diffraction
Author(s) -
Jonathan Pfeiffer,
Kelvin Wagner
Publication year - 2018
Publication title -
applied optics
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.668
H-Index - 197
eISSN - 2155-3165
pISSN - 1559-128X
DOI - 10.1364/ao.57.000c26
Subject(s) - optics , diffraction , materials science , refractive index , physics
A novel technique for measuring the relative photoelastic coefficients using Schaefer-Bergmann diffraction is introduced and applied to fused silica and α - BaB 2 O 4 . The measurements of fused silica agree with the accepted values to within 0.4%, and the α - BaB 2 O 4 measurements are verified with results presented in this paper from the established Dixon method.