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Carrier-envelope offset frequency linewidth narrowing in a Cr:forsterite laser-based frequency comb
Author(s) -
Shun Wu,
Karl A. Tillman,
Brian R. Washburn,
Kristan L. Corwin
Publication year - 2016
Publication title -
applied optics
Language(s) - Uncategorized
Resource type - Journals
ISSN - 0003-6935
DOI - 10.1364/ao.55.009810
Subject(s) - forsterite , laser linewidth , optics , materials science , frequency comb , laser , phase noise , wavelength , physics , geology , mineralogy
Cr:forsterite laser-based frequency combs are useful for spectroscopic purposes in the near-IR wavelength region. However, self-referenced Cr:forsterite combs tend to exhibit wide carrier-envelope offset frequency (f 0 ) linewidths, which result in broad comb teeth. This can be attributed to significant frequency noise across the comb's spectral bandwidth. We have stabilized a prism-based Cr:forsterite laser comb and observed narrowing of the f 0 linewidth from ∼1.4  MHz down to ∼100  kHz by changing only the prism insertion, and to 23 kHz by inserting a knife edge into the intracavity beam while keeping the same prism insertion. The noise dynamics of the Cr:forsterite laser frequency comb are investigated with the goal of explaining this f 0 narrowing phenomenon.

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