Open AccessChromatic-aberration diagnostic based on a spectrally resolved lateral-shearing interferometer
Author(s) -
Seung-Whan Bahk,
C. Dorrer,
R. G. Roides,
J. Bromage
Publication year - 2016
Publication title -
applied optics
Language(s) - English
Resource type - Journals
ISSN - 0003-6935
DOI - 10.1364/ao.55.002413
Subject(s) - optics , chromatic aberration , interferometry , diffraction grating , wavefront , spatial frequency , grating , materials science , spectrometer , shearing interferometer , chromatic scale , physics , astronomical interferometer
A simple diagnostic characterizing one-dimensional chromatic aberrations in a broadband beam is introduced. A Ronchi grating placed in front of a spectrometer entrance slit provides spectrally coupled spatial phase information. The radial-group delay of a refractive system and the pulse-front delay of a wedged glass plate have been characterized accurately in a demonstration experiment.