Chromatic-aberration diagnostic based on a spectrally resolved lateral-shearing interferometer | Zendy

S.-W. Bahk | Zendy; C. Dorrer | Zendy; Rick G. Roides | Zendy; J. Bromage | Zendy

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Chromatic-aberration diagnostic based on a spectrally resolved lateral-shearing interferometer

Author(s) -

S.-W. Bahk,

C. Dorrer,

Rick G. Roides,

J. Bromage

Publication year - 2016

Publication title -

applied optics

Language(s) - English

Resource type - Journals

ISSN - 0003-6935

DOI - 10.1364/ao.55.002413

Subject(s) - optics , chromatic aberration , interferometry , diffraction grating , wavefront , spatial frequency , grating , materials science , spectrometer , shearing interferometer , chromatic scale , physics , astronomical interferometer

A simple diagnostic characterizing one-dimensional chromatic aberrations in a broadband beam is introduced. A Ronchi grating placed in front of a spectrometer entrance slit provides spectrally coupled spatial phase information. The radial-group delay of a refractive system and the pulse-front delay of a wedged glass plate have been characterized accurately in a demonstration experiment.

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