Performance of bent-crystal x-ray microscopes for high energy density physics research | Zendy

Marius Schollmeier | Zendy; Matthias Geißel | Zendy; Jonathon Shores | Zendy; I. C. Smith | Zendy; J. L. Porter | Zendy

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Performance of bent-crystal x-ray microscopes for high energy density physics research

Author(s) -

Marius Schollmeier,

Matthias Geißel,

Jonathon Shores,

I. C. Smith,

J. L. Porter

Publication year - 2015

Publication title -

applied optics

Language(s) - English

Resource type - Journals

ISSN - 0003-6935

DOI - 10.1364/ao.54.005147

Subject(s) - optics , microscope , ray tracing (physics) , bent molecular geometry , physics , image plane , field of view , image resolution , crystal (programming language) , fluence , cardinal point , image (mathematics) , laser , computer science , materials science , computer vision , composite material , programming language

We present calculations for the field of view (FOV), image fluence, image monochromaticity, spectral acceptance, and image aberrations for spherical crystal microscopes, which are used as self-emission imaging or backlighter systems at large-scale high energy density physics facilities. Our analytic results are benchmarked with ray-tracing calculations as well as with experimental measurements from the 6.151 keV backlighter system at Sandia National Laboratories. The analytic expressions can be used for x-ray source positions anywhere between the Rowland circle and object plane. This enables quick optimization of the performance of proposed but untested, bent-crystal microscope systems to find the best compromise between FOV, image fluence, and spatial resolution for a particular application.

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