Open AccessPerformance of bent-crystal x-ray microscopes for high energy density physics research
Author(s) -
M. Schollmeier,
Matthias Geißel,
Jonathon Shores,
I. C. Smith,
J. L. Porter
Publication year - 2015
Publication title -
applied optics
Language(s) - English
Resource type - Journals
ISSN - 0003-6935
DOI - 10.1364/ao.54.005147
Subject(s) - optics , microscope , physics , ray tracing (physics) , bent molecular geometry , image plane , field of view , crystal (programming language) , image resolution , cardinal point , fluence , laser , image (mathematics) , computer science , materials science , computer vision , composite material , programming language
We present calculations for the field of view (FOV), image fluence, image monochromaticity, spectral acceptance, and image aberrations for spherical crystal microscopes, which are used as self-emission imaging or backlighter systems at large-scale high energy density physics facilities. Our analytic results are benchmarked with ray-tracing calculations as well as with experimental measurements from the 6.151 keV backlighter system at Sandia National Laboratories. The analytic expressions can be used for x-ray source positions anywhere between the Rowland circle and object plane. This enables quick optimization of the performance of proposed but untested, bent-crystal microscope systems to find the best compromise between FOV, image fluence, and spatial resolution for a particular application.