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Analytical Description of a Fabry–Perot Photoelectric Spectrometer
Author(s) -
G. Hernández
Publication year - 1966
Publication title -
applied optics
Language(s) - English
Resource type - Journals
ISSN - 0003-6935
DOI - 10.1364/ao.5.001745
Subject(s) - optics , fabry–pérot interferometer , spectrometer , photoelectric effect , flatness (cosmology) , scintillation , doppler effect , photodetector , curvature , physics , materials science , wavelength , detector , geometry , mathematics , cosmology , quantum mechanics , astronomy
An analytical expression for the response of a complete Fabry-Perot photoelectric spectrometer to a line profile is derived. The case of a doppler-broadened Lorentzian profile examined by a spectrometer comprised of an etalon of variable thickness and reflectivity, with surface defects consisting of spherical curvature, as well as microscopic flatness imperfections, a finite exploring slit in front of the photodetector, and bandwidth limiting circuits is considered. Some of the properties and uses of the expression obtained are discussed.

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