Global tip-tilt and high-order aberration correction with plenoptic wavefront sensors in closed-loop AO systems

The plenoptic wavefront sensor (PlWFS) has been proposed as being suitable for operating on extended objects in adaptive optics (AO) systems. We propose a new self-referencing method that uses the cell image of PlWFS as a correlation reference and enables the simultaneous measurement of high-order aberrations and tilt. Simulations have been performed for different operating conditions to verify the feasibility of the proposed method. These show that using the cell image results in better AO performance compared to existing reference generation techniques and allows stable wavefront tilt control with a small residual variance.