z-logo
Premium
An index‐based short form of the WAIS‐III with accompanying analysis of reliability and abnormality of differences
Author(s) -
Crawford John R.,
Allum Samantha.,
Kinion Jess E.
Publication year - 2008
Publication title -
british journal of clinical psychology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.479
H-Index - 92
eISSN - 2044-8260
pISSN - 0144-6657
DOI - 10.1348/014466507x258859
Subject(s) - reliability (semiconductor) , short forms , index (typography) , abnormality , psychology , wechsler adult intelligence scale , percentile , percentile rank , statistics , psychometrics , reliability engineering , computer science , clinical psychology , cognition , mathematics , social psychology , psychiatry , engineering , power (physics) , physics , quantum mechanics , world wide web
To develop an index-based, seven subtest, short form of the WAIS-III that offers the same comprehensive range of analytic methods available for the full-length version.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here