Open AccessReliability Estimation of 4 × 4 SENs Using UGF Method
Author(s) -
Vaibhav Bisht,
Sukhwinder Singh
Publication year - 2021
Publication title -
journal of reliability and statistical studies
Language(s) - English
Resource type - Journals
eISSN - 2229-5666
pISSN - 0974-8024
DOI - 10.13052/jrss0974-8024.1418
Subject(s) - reliability (semiconductor) , interconnection , simple (philosophy) , reliability engineering , computer science , function (biology) , multistage interconnection networks , basis (linear algebra) , engineering , mathematics , computer network , physics , power (physics) , philosophy , geometry , epistemology , quantum mechanics , evolutionary biology , biology