Open AccessEfficient Method Based on SMW Formula for Analyzing PEC Targets with Partial and Thin Coatings
Author(s) -
Xinlei Chen,
Zhiwen Dong,
Guiyue Yu,
Ziwei Li,
Lichang Lu,
Changzhi Gu
Publication year - 2021
Publication title -
applied computational electromagnetics society journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.216
H-Index - 29
eISSN - 1943-5711
pISSN - 1054-4887
DOI - 10.13052/2021.aces.j.361002
Subject(s) - discretization , coating , perfect conductor , scattering , matrix (chemical analysis) , inverse , impedance parameters , electrical impedance , inverse scattering problem , inverse problem , materials science , mathematical analysis , mathematics , mathematical optimization , computer science , physics , optics , geometry , composite material , quantum mechanics
The analysis of the electromagnetic scattering from the perfect electric conductor (PEC) partially coated with thin material is a significant task in stealth design. Previous research has shown the scattering can be calculated by only discretizing the current on PEC in the case of thin coating layers. However, it has a downside that it will recalculate a complete solution when the geometry or electromagnetic properties of the coating changes. In this paper, a Sherman-Morrison-Woodbury (SMW) formula-based method is proposed to address this problem. According to the SMW formulation, it can reuse the inverse impedance matrix of the PEC part to efficiently obtain the solutions when local coating changes, so it can avoid the subsequent complete inverse of the new impedance matrix. Furthermore, it employs the fast direct solution method based on the SMW formulation to accelerate the calculation of inverse matrix of the PEC part. Numerical results demonstrate the performance of the proposed method.