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Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites
Author(s) -
Rohit Nikam,
Arun V. Patil,
Kailas Haribhau Kapadnis,
Aditi Ahirrao,
R. Y. Borse
Publication year - 2021
Publication title -
oriental journal of chemistry/oriental journal of chemistry
Language(s) - English
Resource type - Journals
eISSN - 2231-5039
pISSN - 0970-020X
DOI - 10.13005/ojc/370515
Subject(s) - materials science , tin , tin oxide , zirconium , oxide , scanning electron microscope , fourier transform infrared spectroscopy , energy dispersive x ray spectroscopy , indium tin oxide , composite material , thin film , chemical engineering , nanotechnology , metallurgy , engineering
There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements, in the construction of integrated passive devices and sensors. Pure tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) thick films of dimensions 2 cm×1 cm incorporated into pure tin oxide (SnO2) were prepared with standard screen printing method. All samples were fabricated on glass support. The thick films were subjected to drying and firing at 5000C at 5 hours in muffle furnace. Thick films of tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) incorporated into pure tin oxide (SnO2) were checked for Scanning Electron Microscopy (S.E.M), Energy Dispersive X-ray Spectroscopy (E.D.A.X), X-ray diffraction (X.R.D), Fourier Transform infra-Red (F.T.I.R) and Ultra-Violet-Visible spectroscopy (U.V) for surface morphology, elemental analysis, crystalline phases of films, vibrational and spectrophotometric study respectively. In this research paper the spectrophotometric parameters such as absorbance and absorption coefficient with pure and compositional thick films were a part of investigation and surveillance.

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