Open AccessStatistical MOSFET Parameter Extraction with Parameter Selection for Minimal Point Measurement
Author(s) -
Marga Alisjahbana
Publication year - 2013
Publication title -
telkomnika
Language(s) - English
Resource type - Journals
eISSN - 2302-9293
pISSN - 1693-6930
DOI - 10.12928/telkomnika.v11i3.984
Subject(s) - sensitivity (control systems) , mosfet , extraction (chemistry) , estimation theory , model selection , model parameter , curve fitting , mathematics , statistics , transistor , algorithm , computer science , electronic engineering , physics , voltage , engineering , chemistry , quantum mechanics , chromatography