Open AccessA Low Cost C8051F006 SoC-Based Quasi-Static C-V Meter for Characterizing Semiconductor Devices
Author(s) -
Endah Rahmawati,
Riska Ekawita,
Maman Budiman,
Mikrajuddin Abdullah,
Khairurrijal Khairurrijal
Publication year - 2012
Publication title -
telkomnika
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.258
H-Index - 23
eISSN - 2302-9293
pISSN - 1693-6930
DOI - 10.12928/telkomnika.v10i4.536
Subject(s) - metre , semiconductor , semiconductor device , computer science , electrical engineering , embedded system , optoelectronics , materials science , physics , engineering , nanotechnology , layer (electronics) , astronomy