Open AccessStudy of Interface Trapped Charges Effect on Performance of Junction Less Trial Material Cylindrical Surrounding-Gate MOSFETs
Author(s) -
Lagraf Fairouz,
Rechem Djamil,
K. Guergouri
Publication year - 2019
Publication title -
journal of new technology and materials
Language(s) - English
Resource type - Journals
ISSN - 2170-161X
DOI - 10.12816/0056116
Subject(s) - materials science , mosfet , optoelectronics , interface (matter) , gate voltage , engineering physics , condensed matter physics , electrical engineering , composite material , voltage , engineering , physics , transistor , capillary number , capillary action
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