Open AccessThe Barrier Height and the Series Resistance of Ag / SnO2 / Si / Au Schottky Diode Determined by Cheung and Lien Methods
Author(s) -
M. Benhaliliba
Publication year - 2015
Publication title -
journal of new technology and materials
Language(s) - English
Resource type - Journals
ISSN - 2170-161X
DOI - 10.12816/0019429
Subject(s) - equivalent series resistance , schottky diode , schottky barrier , materials science , diode , optoelectronics , electrical engineering , engineering , voltage