Reliability and Validity of the Korean Kessler Foundation Neglect Assessment Process
Author(s) -
Bo-Ram Kim,
Eun Hwa Jeong,
Mooyeon OhPark,
Kyungjae Lee,
Hyun-Tae Kim,
Seung Don Yoo,
Tae Im Yi,
MinYoung Kim,
Jongmin Lee
Publication year - 2017
Publication title -
brain and neurorehabilitation
Language(s) - English
Resource type - Journals
eISSN - 2383-9910
pISSN - 1976-8753
DOI - 10.12786/bn.2017.10.e10
Subject(s) - foundation (evidence) , reliability (semiconductor) , neglect , reliability engineering , psychology , process (computing) , validity , computer science , forensic engineering , engineering , political science , clinical psychology , psychometrics , law , psychiatry , power (physics) , physics , quantum mechanics , operating system
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