Open AccessLow Contrast Surface Inspection under Uneven Illumination Using Independent Subspace Analysis
Author(s) -
Hao Wu
Publication year - 2018
Publication title -
destech transactions on engineering and technology research
Language(s) - English
Resource type - Journals
ISSN - 2475-885X
DOI - 10.12783/dtetr/amee2018/25304
Subject(s) - subspace topology , contrast (vision) , artificial intelligence , computer vision , basis (linear algebra) , computer science , set (abstract data type) , pattern recognition (psychology) , image (mathematics) , surface (topology) , image contrast , mathematics , geometry , programming language