Open AccessScale-depended Choice of Scanning Rate for AFM Measurements
Author(s) -
Ştefan Ţălu,
Dinara Sobola,
Shahram Solaymani,
Rashid Dallaev,
Jitka Brüstlová
Publication year - 2018
Publication title -
destech transactions on computer science and engineering
Language(s) - English
Resource type - Journals
ISSN - 2475-8841
DOI - 10.12783/dtcse/cnai2018/24197
Subject(s) - fractal , calibration , surface finish , surface (topology) , surface roughness , scale (ratio) , materials science , fractal dimension , fractal analysis , sample (material) , atomic force microscopy , distortion (music) , optics , computer science , geometry , statistics , mathematics , nanotechnology , physics , mathematical analysis , composite material , amplifier , cmos , optoelectronics , quantum mechanics , thermodynamics