Open AccessReducing Test Cost of Infrared Detectors: A Machine Learning Approach to Failure Prediction of Infrared Detectors
Author(s) -
Qingrong Zou,
Jian Qing Shi,
Xu Qing'an,
Yikai Shao,
Zhiqiang Lv
Publication year - 2018
Publication title -
destech transactions on computer science and engineering
Language(s) - English
Resource type - Journals
ISSN - 2475-8841
DOI - 10.12783/dtcse/cmsms2018/25258
Subject(s) - detector , infrared , computer science , infrared detector , stage (stratigraphy) , test (biology) , reliability engineering , artificial intelligence , optics , engineering , physics , telecommunications , paleontology , biology
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