Open AccessInfluence of Si and La on Workability of GH536
Author(s) -
Kai Zhao
Publication year - 2018
Publication title -
destech transactions on computer science and engineering
Language(s) - English
Resource type - Journals
ISSN - 2475-8841
DOI - 10.12783/dtcse/cmsms2018/25250
Subject(s) - materials science , scanning electron microscope , impurity , metallurgy , superalloy , silicon , optical microscope , electron microscope , composite material , optics , microstructure , chemistry , physics , organic chemistry