Open AccessResearch on Experiment Technology for High Reliability Flash Storage Systems
Author(s) -
KHALED AOURRA,
QUAN-XIN ZHANG,
JIA-MIN ZHENG,
YUAN-ZHANG LI
Publication year - 2018
Publication title -
destech transactions on computer science and engineering
Language(s) - English
Resource type - Journals
ISSN - 2475-8841
DOI - 10.12783/dtcse/cimns2017/17411
Subject(s) - raid , computer science , reliability (semiconductor) , flash (photography) , computer data storage , mass storage , reliability engineering , flash memory , embedded system , operating system , engineering , art , power (physics) , physics , quantum mechanics , visual arts