Open AccessCalculation of indicators of resistance of work of digital chips in CAD
Author(s) -
Ачкасов,
V. Achkasov,
Чевычелов,
Yu. Chevychelov,
Анциферова,
В. Анциферова,
Лавлинский,
V. Lavlinskiy,
Зольников,
Vladimir Zolnikov,
Сербулов,
Yuriy Serbulov,
Табаков,
Yuriy Tabakov
Publication year - 2015
Publication title -
lesotehničeskij žurnal
Language(s) - English
Resource type - Journals
ISSN - 2222-7962
DOI - 10.12737/8494
Subject(s) - cad , electronic circuit , cardinality (data modeling) , electronic engineering , pulse (music) , integrated circuit , computer science , neutron , computer aided design , affect (linguistics) , digital electronics , engineering , engineering drawing , electrical engineering , data mining , physics , psychology , nuclear physics , operating system , detector , communication
The technique of radiation-resistant design of integrated circuits in computer-aided design is presented and comparisons with expert data are provided, which are affected by these types of radiations like gam-ma, x-ray and neutron radiation, as well as the impact of the neutron pulse, which affect largely, on the gain of the transistor are examined. Different types of cardinality doses are represented that affect the crystals of integrated circuits based on the real pulse shape of artificial intelligence.