Open AccessOptical Methods in Characterization of HTSC Thin Film Substrates
Author(s) -
W. RybaRomanowski
Publication year - 1997
Publication title -
acta physica polonica a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.217
H-Index - 38
eISSN - 1898-794X
pISSN - 0587-4246
DOI - 10.12693/aphyspola.92.135
Subject(s) - characterization (materials science) , materials science , thin film , optoelectronics , nanotechnology
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