Open AccessApplication of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions
Author(s) -
R. Stachura,
A. KubalaKukuś,
D. Banaś,
I. Stabrawa,
Karol Szary,
P. Jagodziński,
Giuliana Aquilanti,
Iva Božičević Mihalić,
M. Pajek,
J. Semaniak,
M. Teodorczyk
Publication year - 2020
Publication title -
acta physica polonica. a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.217
H-Index - 38
eISSN - 1898-794X
pISSN - 0587-4246
DOI - 10.12693/aphyspola.137.38
Subject(s) - irradiation , ion , materials science , reflectometry , x ray , synchrotron radiation , radiation , synchrotron , atomic physics , radiochemistry , physics , optics , nuclear physics , chemistry , time domain , quantum mechanics , computer science , computer vision