Open AccessTEM and HAADF STEM Imaging of Dislocation Loops in Irradiated GaAs
Author(s) -
J.H. Neethling,
A. Janse van Vuuren,
E.J. Olivier,
Peter A. van Aken
Publication year - 2019
Publication title -
acta physica polonica a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.217
H-Index - 38
eISSN - 1898-794X
pISSN - 0587-4246
DOI - 10.12693/aphyspola.136.245
Subject(s) - materials science , transmission electron microscopy , scanning transmission electron microscopy , annealing (glass) , dislocation , stacking fault , dark field microscopy , stacking , irradiation , molecular physics , crystallography , condensed matter physics , nuclear magnetic resonance , microscopy , optics , chemistry , physics , nanotechnology , nuclear physics , composite material
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