Open AccessInfluence of SiC Surface Preparation on Homoepitaxial Growth; X-ray Reflectometric Studies
Author(s) -
K. Mazur,
W. Wierzchowski,
K. Wieteska,
W. Hofman,
H. Sakowska,
Kinga Kościewicz,
W. Strupiński,
W. Graeff
Publication year - 2010
Publication title -
acta physica polonica. a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.217
H-Index - 38
eISSN - 1898-794X
pISSN - 0587-4246
DOI - 10.12693/aphyspola.117.272
Subject(s) - x ray , materials science , surface (topology) , crystallography , optics , chemistry , geometry , physics , mathematics